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Thickness dependence of photoluminescence-decay profiles of exciton-exciton scattering in ZnO thin films

Shuji Wakaiki, Hideki Ichida, Toshiki Kawase, Kohji Mizoguchi, DaeGwi Kim, Masaaki Nakayama and Yasuo Kanematsu

Eur. Phys. J. B, 86 9 (2013) 387

DOI: https://doi.org/10.1140/epjb/e2013-30631-5

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