Study of structural and electrical properties of thin NiOx films prepared by ion beam sputtering of Ni and subsequent thermo-oxidationP. Horak, V. Lavrentiev, V. Bejsovec, J. Vacik, S. Danis, M. Vrnata and J. KhunEur. Phys. J. B, 86 11 (2013) 470DOI: https://doi.org/10.1140/epjb/e2013-30969-6