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Review of thermoelectric characterization techniques suitable for SiGe multilayer structures

Stefano Cecchi, Lourdes Ferre Llin, Tanja Etzelstorfer and Antonio Samarelli

Eur. Phys. J. B, 88 3 (2015) 70

DOI: https://doi.org/10.1140/epjb/e2015-50672-x

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