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Double Penning trap technique for precise g factor determinations in highly charged ions

H. Häffner, T. Beier, S. Djekić, N. Hermanspahn, H.-J. Kluge, W. Quint, S. Stahl, J. Verdú, T. Valenzuela and G. Werth

Eur. Phys. J. D, 22 2 (2003) 163-182

DOI: https://doi.org/10.1140/epjd/e2003-00012-2

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