Double Penning trap technique for precise g factor determinations in highly charged ionsH. Häffner, T. Beier, S. Djekić, N. Hermanspahn, H.-J. Kluge, W. Quint, S. Stahl, J. Verdú, T. Valenzuela and G. WerthEur. Phys. J. D, 22 2 (2003) 163-182DOI: https://doi.org/10.1140/epjd/e2003-00012-2