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Atom chips in the real world: the effects of wire corrugation

T. Schumm, J. Estève, C. Figl, J.-B. Trebbia, C. Aussibal, H. Nguyen, D. Mailly, I. Bouchoule, C. I. Westbrook and A. Aspect

Eur. Phys. J. D, 32 2 (2005) 171-180

DOI: https://doi.org/10.1140/epjd/e2005-00016-x

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EPJ A Topical Collection devoted to the legacy of Peter Schuck
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EPJ B Topical Issue: Superconducting Graphene
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EPJ D Topical Issue: Electron and Positron Interactions and Their Applications: a tribute to Professor Michael Brunger
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EPJ E Topical Issue: Endowing Active Particles with Artificial Intelligence
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