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AFM and contact angle investigation of growth and structure of pp-HMDSO thin films

E. Grimoldi, S. Zanini, R. A. Siliprandi and C. Riccardi

Eur. Phys. J. D, 54 2 (2009) 165-172

DOI: https://doi.org/10.1140/epjd/e2009-00117-6

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