Dielectronic recombination rate coefficients for the Ni isoelectronic sequenceY. Zhang, C. Y. Chen, M. Huang, Y. S. Wang and Y. M. ZouEur. Phys. J. D, 56 2 (2010) 157-166DOI: https://doi.org/10.1140/epjd/e2009-00285-3