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Ultra-low-energy electron scattering cross section measurements of Ar, Kr and Xe employing the threshold photoelectron source

M. Kitajima, M. Kurokawa, T. Kishino, K. Toyoshima, T. Odagiri, H. Kato, K. Anzai, M. Hoshino, H. Tanaka and K. Ito

Eur. Phys. J. D, 66 5 (2012) 130

DOI: https://doi.org/10.1140/epjd/e2012-20629-0

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