Nanoscale characterization of ion tracks: MC simulations versus analytical approachM.U. Bug, E. Surdutovich, H. Rabus, A.B. Rosenfeld and A.V. Solov’yovEur. Phys. J. D, 66 11 (2012) 291DOI: https://doi.org/10.1140/epjd/e2012-30183-4