Comparison of the effect of NaOH and TE buffer on 25 to 100 eV electron induced damage to ΦX174 dsDNAS.V.K. Kumar, Megha Murali and Preksha KushwahaEur. Phys. J. D, 69 9 (2015) 204DOI: https://doi.org/10.1140/epjd/e2015-60203-8