Measurement of adhesion energies and Young's modulus in thin polymer films using a novel axi-symmetric peel test geometryA. N. Raegen, K. Dalnoki-Veress, K. -T. Wan and R. A. L. JonesEur. Phys. J. E, 19 4 (2006) 453-459DOI: https://doi.org/10.1140/epje/i2005-10069-7