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Ellipsometry measurements of glass transition breadth in bulk films of random, block, and gradient copolymers

M. M. Mok, J. Kim, S. R. Marrou and J. M. Torkelson

Eur. Phys. J. E, 31 3 (2010) 239-252

DOI: https://doi.org/10.1140/epje/i2010-10569-3

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EPJ A Topical Collection devoted to the legacy of Peter Schuck
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