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Measuring thin films using quantitative frustrated total internal reflection (FTIR)

Minori Shirota, Michiel A. J. van Limbeek, Detlef Lohse and Chao Sun

Eur. Phys. J. E, 40 5 (2017) 54

DOI: https://doi.org/10.1140/epje/i2017-11542-4

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