Fractal analysis as a potential tool for surface morphology of thin films
Eur. Phys. J. Plus, 132 12 (2017) 551
DOI: https://doi.org/10.1140/epjp/i2017-11826-8
Download citation
Topical Collections
Open calls for papers
-
EPJ AM Call for papers: Themed Issue on Global Advances in Electromagnetic Metasurfaces for Space
(EPJ AM)
-
Call for papers : Special Issue on Imaging, Diffraction, and Spectroscopy on the micro/nanoscale
(EPJ AP)
-
EPJ H Special Issue: History for Physics: Contextualizing modern developments in the foundations of quantum theory
(EPJ H)
-
EPJ N Topical Issue on Research Reactor use and projects on modeling and experimental breakthroughs for Advanced Nuclear Reactors
(EPJ N)