Characterization and setting protocol for a simultaneous X-ray Diffraction - X-ray Fluorescence system (XRD/XRF) for in situ analysisValentina Aguilar, José Luis Ruvalcaba-Sil, Lauro Bucio and Eric M. Rivera-MuñozEur. Phys. J. Plus, 134 6 (2019) 286DOI: https://doi.org/10.1140/epjp/i2019-12652-8