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Temperature-dependent criticality in random 2D Ising models

Matteo Metra, Luc Zorrilla, Maurizio Zani, Ezio Puppin and Paolo Biscari

Eur. Phys. J. Plus, 136 9 (2021) 939

DOI: https://doi.org/10.1140/epjp/s13360-021-01939-2

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