Residual stress in Ni-Mn-Ga thin films deposited on different substratesS. Doyle, V. A. Chernenko, S. Besseghini, A. Gambardella, M. Kohl, P. Müllner and M. OhtsukaEur. Phys. J. Special Topics, 158 (2008) 99-105DOI: https://doi.org/10.1140/epjst/e2008-00660-8