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Residual stress in Ni-Mn-Ga thin films deposited on different substrates

S. Doyle, V. A. Chernenko, S. Besseghini, A. Gambardella, M. Kohl, P. Müllner and M. Ohtsuka

Eur. Phys. J. Special Topics, 158 (2008) 99-105

DOI: https://doi.org/10.1140/epjst/e2008-00660-8

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