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Transformation behavior of Ni-Mn-Ga/Si(100) thin film composites with different film thicknesses

S. Besseghini, A. Gambardella, V. A. Chernenko, M. Hagler, C. Pohl, P. Müllner, M. Ohtsuka and S. Doyle

Eur. Phys. J. Special Topics, 158 (2008) 179-185

DOI: https://doi.org/10.1140/epjst/e2008-00673-3

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