Rapid X-ray reflectivity measurement using a new liquid interface reflectometer at SPring-8Y. F. Yano, T. Uruga, H. Tanida, H. Toyokawa, Y. Terada, M. Takagaki and H. YamadaEur. Phys. J. Special Topics, 167 (2009) 101-105DOI: https://doi.org/10.1140/epjst/e2009-00943-6