The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymersS. Swaraj, C. Wang, T. Araki, G. Mitchell, L. Liu, S. Gaynor, B. Deshmukh, H. Yan, C. R. McNeill and H. AdeEur. Phys. J. Special Topics, 167 (2009) 121-126DOI: https://doi.org/10.1140/epjst/e2009-00946-3