EPJ

a
b
c
d
e
ap
st
h
plus
ds
pv
ti
qt
am
n

woc
rnc

Distinguished EPJ Referees

Authors & Readers

Submission
- EPJ A
- EPJ B
- EPJ C
- EPJ D
- EPJ E
- EPJ AP
- EPJ ST
- EPJ H
- EPJ PLUS
- EPJ DS
- EPJ PV
- EPJ TI
- EPJ QT
- EPJ AM
- EPJ N
- EPJ WOC
LaTeX Macros
- EPJ A
- EPJ B
- EPJ C
- EPJ D
- EPJ E
- EPJ AP
- EPJ ST
- EPJ H
- EPJ PLUS
- EPJ DS
- EPJ TI
- EPJ QT
- EPJ WOC
TOC alert
- EPJ A
- EPJ B
- EPJ C
- EPJ D
- EPJ E
- EPJ AP
- EPJ ST
- EPJ H
- EPJ PLUS
- EPJ DS
- EPJ PV
- EPJ TI
- EPJ QT
- EPJ AM
- EPJ N
- EPJ WOC
RSS feeds
Permission Requests
Policy on Publishing Integrity
FAQ
Videos presenting EPJ

Follow @EPJscience

Download citation

Resistance metrology based on the quantum Hall effect

W. Poirier and F. Schopfer

Eur. Phys. J. Special Topics, 172 (2009) 207-245

DOI: https://doi.org/10.1140/epjst/e2009-01051-5

Back to the article

Topical Collections

Open calls for papers

EPJ A Topical Collection devoted to the legacy of Peter Schuck
(EPJ A)

EPJ B Topical Issue: Superconducting Graphene
(EPJ B)

EPJ D Topical Issue: Electron and Positron Interactions and Their Applications: a tribute to Professor Michael Brunger
(EPJ D)

EPJ E Topical Issue: Endowing Active Particles with Artificial Intelligence
(EPJ E)

EPJ H Special Issue: History for Physics: Contextualizing modern developments in the foundations of quantum theory
(EPJ H)

EPJ N Topical Issue on Research Reactor use and projects on modeling and experimental breakthroughs for Advanced Nuclear Reactors
(EPJ N)

EPJ Plus Focus Point Issue: The Magic of Glass
(EPJ PLUS)

EPJ Quantum Technology - Open Calls for Papers
(EPJ QT)

EPJ ST Special Issue: Benchmarking Physics at Future Lepton Colliders in the Light of LHC
(EPJ ST)

EPJ Techniques and Instrumentation - Open Calls for Papers
(EPJ TI)