Distinguished EPJ Referees

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Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures - MAD and DAFS for studying Semiconductor Nanostructures

Eur. Phys. J. Special Topics, 208 (2012) 189-216
DOI: https://doi.org/10.1140/epjst/e2012-01619-x


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