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Analysis of velocity-mapped ion images from high-resolution crossed-beam scattering experiments: a tutorial review

Alexander von Zastrow, Jolijn Onvlee, David H. Parker and Sebastiaan Y.T. van de Meerakker

EPJ Techn Instrum, 2 1 (2015) 11

DOI: https://doi.org/10.1140/epjti/s40485-015-0020-z

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